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Interfacial interaction in monolayer transition metal dichalcogenides (MX2)/metal oxide heterostructures and its effects on electronic and optical properties: The case of MX2/CeO2

机译:单层过渡金属二硫属化物中的界面相互作用   (mX2)/金属氧化物异质结构及其对电子和光学的影响   特性:mX2 / CeO2的情况

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摘要

Two-dimensional transition metal dichalcogenides (MX2)/metal oxideheterostructures have shown unique physical properties, making them promisingmaterials for various applications ranging from photocatalysis to solar energyconversion. Understanding the interfacial interactions is highly desirable fordesigning these heterostructures having excellent performance. Here wesystematically study the interfacial interaction in monolayer MX2 (M=Mo, W;X=S, Se)/CeO2 heterostructures and its effects on electronic and opticalproperties by density functional theory. It is found that the interfacialinteraction in the MX2/CeO2 depends predominantly on the chalcogen (X) element.Particularly, the band gap variation and important electronic states atconduction band minimum or valence band maximum of the heterostructures aredetermined by the strength of interfacial interaction. The MX2/CeO2heterostructures with the same chalcogen (X) element have similar absorptionspectra from ultraviolet to near-infrared regions. These results suggest thatthe chalcogen (X) element is a key factor in tuning the properties of MX2/metaloxide heterostructures.
机译:二维过渡金属二硫化碳(MX2)/金属氧化物异质结构显示出独特的物理特性,使其成为从光催化到太阳能转化等各种应用的有前途的材料。为了设计具有优异性能的这些异质结构,非常需要了解界面相互作用。在这里,我们通过密度泛函理论系统地研究了单层MX2(M = Mo,W; X = S,Se)/ CeO2异质结构中的界面相互作用及其对电子和光学性质的影响。发现MX2 / CeO2中的界面相互作用主要取决于硫族元素(X)。特别是,界面相互作用的强度决定了异质结构的导带最小或价带最大的带隙变化和重要的电子态。具有相同硫族元素(X)元素的MX2 / CeO2异质结构从紫外到近红外区域具有相似的吸收光谱。这些结果表明,硫属元素是调节MX2 /金属氧化物异质结构性能的关键因素。

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